Descripción del proyecto
Organic semiconductors have become promising materials for the design of electronic devices since they are light, flexible, low cost, and feasible for large scale manufacturing. The efficiency of an organic device has a strong dependency on the selected organic molecule and its organization in the electronic device. Fabrication processes with standard organic molecules currently produce thin films consisting of a large number of crystalline domains without control of their orientation nor of the locations of the originated grain boundaries. Grain boundaries can act as charge traps and electron scattering centers, resulting in a reduction of the electron mobility within the film. Therefore, there are big differences in the electronic properties from one device to another device even if they are fabricated under the same conditions. Thus, a major effort within organic electronics is devoted to refining the fabrication processes leading to uniform and controlled electronic properties of the devices. In this proposal, it is planned that I develop a novel atomic force microscopy (AFM) technique based on torsional eigenmodes capable of detecting fast and in a precise manner the crystalline domains of anisotropic organic layers utilized in organic devices. I will receive training in the fabrication processes of organic thin films by the host group and I will look for fabrication strategies to optimize the organic film deposition that enhances the electronic performance of organic devices. The developed AFM technique will be applied to study the domain distribution of the fabricated organic samples.
This action is expected to have a relevant impact in the organic electronic field, enhancing the characterization and fabrication methods for organic device production that lead to an increase in energy efficiency. Likewise, this action will impact my career, enabling the transition into a position as an independent researcher.