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Integrated Real Time Measurement Platforms for Nanoparticles and Nanoparticle Th...

Integrated Real Time Measurement Platforms for Nanoparticles and Nanoparticle Thin Films One of the major barriers towards the successful introduction of nanoparticles (NP) into many applications is the lack of a tight control on their properties ((size, shape, crystallinity, composition, core-shell, functionalization... ver más

13/06/2015

KU Leuven

4M€

Presupuesto del proyecto: 4M€

Líder del proyecto

KATHOLIEKE UNIVERSITEIT LEUVEN No se ha especificado una descripción o un objeto social para esta compañía.

TRL 4-5

Fecha límite participación Sin fecha límite de participación.

Ver 6 Participantes

Financiación concedida El organismo FP7 notifico la concesión del proyecto el día 2015-06-13 No tenemos la información de la convocatoria

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No hay información privada compartida para este proyecto. Habla con el coordinador.

6 Participantes

KU Leuven

0.00€ | Lider

AXS

N.D. | Participante

COR

N.D. | Participante

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Líder del proyecto

KATHOLIEKE UNIVERSITEIT LEUVEN No se ha especificado una descripción o un objeto social para esta compañía.

TRL 4-5

Presupuesto del proyecto 4M€

Fecha límite de participación Sin fecha límite de participación.

Descripción del proyecto One of the major barriers towards the successful introduction of nanoparticles (NP) into many applications is the lack of a tight control on their properties ((size, shape, crystallinity, composition, core-shell, functionalization, etc). This can only be resolved by the simultaneous use of several metrology methods, to extract the relevant information in real-time and to establish of a feedback control loop. In this project we take the first steps towards this goal by proposing the required concepts and methods. The main goal of this project is therefore to develop real-time characterization metrology tools to measure the properties of nanoparticles, functionalized NPs and NP thin films. To enable a real-time and a complete characterization of NP properties we drastically extend the capabilities of Dynamic Light Scattering (DLS), Zeta Potential (ZP) and Small Angle X-ray Scattering (SAXS) and combine those into an integrated real-time NPs measurement platform. New methods to measure the flux of NPs in the gas phase and the properties of NP thin films and heterostructures will be developed based on ultraviolet and vacuum ultraviolet radiation. These will be combined with Grazing Incidence SAXS and Reflection High Energy Electron Diffraction into a real-time NP thin film measurement platform. Standard operating procedures will be developed for these instrument combinations so that a multi-method metrology standard can be defined based on the (quasi-) simultaneous measurement of complimentary properties with the different tools. Finally, the capabilities of these integrated measurement platforms will be tested against two high throughput lines for the production of NP in solution and for the growth of NP thin films. This project will be carried out by four Small and Medium Enterprises -- all active in equipment and metrology development -- two Industrial partners and two institutes for Higher and Secondary Education.

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