High Performance and High Yield Heterogeneous III V Si Photonic Integrated Circu...
High Performance and High Yield Heterogeneous III V Si Photonic Integrated Circuits using a Thin and Uniform Bonding Layer
The objective of PICTURE project is to develop a photonic integration technology by bonding multi-III-V-dies of different epitaxial stacks to SOI wafers with a thinner and uniform dielectric bonding layer. This heterogeneous integ...
ver más
¿Tienes un proyecto y buscas un partner? Gracias a nuestro motor inteligente podemos recomendarte los mejores socios y ponerte en contacto con ellos. Te lo explicamos en este video
Proyectos interesantes
INSPIRE
InP on SiN Photonic Integrated circuits REalized through waf...
5M€
Cerrado
PhotonICSWARM
Photonic Integrated Circuits using Scattered Waveguide eleme...
2M€
Cerrado
PID2020-115353RA-I00
METAMATERIALES SUBLONGITUD DE ONDA PARA OPTICA INTEGRADA DE...
94K€
Cerrado
POTION
Photodiode integration on silicon nitride
191K€
Cerrado
SEQUOIA
Energy efficient Silicon transmittEr using heterogeneous int...
5M€
Cerrado
EQC2019-005820-P
Sistema de caracterización de dispositivos fotónicos de band...
253K€
Cerrado
Información proyecto PICTURE
Duración del proyecto: 49 meses
Fecha Inicio: 2017-11-21
Fecha Fin: 2021-12-31
Líder del proyecto
IIIV LAB
No se ha especificado una descripción o un objeto social para esta compañía.
TRL
4-5
Presupuesto del proyecto
4M€
Fecha límite de participación
Sin fecha límite de participación.
Descripción del proyecto
The objective of PICTURE project is to develop a photonic integration technology by bonding multi-III-V-dies of different epitaxial stacks to SOI wafers with a thinner and uniform dielectric bonding layer. This heterogeneous integration platform will enable higher performance lasers and photo-detectors using the optimized III-V dies. In addition, the thinner bonding layer will lead to record performance MOSCAP III-V/Si modulators, and to a new generation of wavelength tunable distributed feedback lasers. Moreover the full process including SOI process, bonding, III-V and back-end process will be made on a 200mm R&D CMOS line, leading to higher yield, smaller footprint and lower cost PICs. Two types of PICs with a total capacity of 400Gb/s will be developed, packaged and validated in system configuration.
In parallel, PICTURE project will develop direct growth of high performance quantum-dot lasers and selective area growth on bonded templates for high density future generation of PICs.
The project is coordinated by III-V Lab, and includes University of Southampton, CEA, University College London, Imec, Tyndall, Argotech and Nokia Bell Labs. The consortium is highly complementary, covering all skills required to achieve the project objectives: growth of semiconductor materials, silicon process and III-V process, design and characterization of PICs, prototyping and assessment of PICs in high bit rate digital communication systems:
Apart from the adequacy of the consortium to achieve collectively the project objectives, the consortium partners have the potential to set up a comprehensive supply chain for the future exploitation of the project results, either by exploiting the results in house or by setting up suitable partnerships.