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CITCOM

Financiado

A Complimentary Inspection Technique based on Computer Tomography and Plenoptic...

A Complimentary Inspection Technique based on Computer Tomography and Plenoptic Camera for MEMS Components For the latest generation of micro-fabricated devices that are currently being developed, no suitable in-line production inspection equipment is available, simply because current inspection equipment expects planar processing whil... ver más

31/12/2020

CSEM

6M€

Presupuesto del proyecto: 6M€

Líder del proyecto

CSEM CENTRE SUISSE DELECTRONIQUE ET DE MICROT... No se ha especificado una descripción o un objeto social para esta compañía.

TRL 4-5

Ver 13 Participantes

Financiación concedida El organismo H2020 notifico la concesión del proyecto el día 2020-12-31

Línea de financiación objetivo El proyecto se financió a través de la siguiente ayuda:

FOF-08-2017: In-line measurement and control for micro-/nano-enabled high-volume manufacturing for enhanced reliability

I+D

Cerrada hace 7 años

0% 100%

13 Participantes

CSEM

829.92K€ | Lider

CONSERVAS FREDO

623.20K€ | Participante

PHILIPS ELECTRONICS NEDERLAN...

325.45K€ | Participante

Polytec

57.80K€ | Participante

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Últimas noticias

27-11-2024: Videojuegos y creaci... Se abre la línea de ayuda pública: Ayudas para la promoción del sector del videojuego, del pódcast y otras formas de creación digital

27-11-2024: DGIPYME En las últimas 48 horas el Organismo DGIPYME ha otorgado 1 concesiones

27-11-2024: FUNDACION-EOI En las últimas 48 horas el Organismo FUNDACION EOI ha otorgado 2 concesiones

Duración del proyecto: 40 meses Fecha Inicio: 2017-08-02
Fecha Fin: 2020-12-31

Presupuesto del proyecto 6M€

Descripción del proyecto For the latest generation of micro-fabricated devices that are currently being developed, no suitable in-line production inspection equipment is available, simply because current inspection equipment expects planar processing while most of the devices are often highly 3D in nature e.g. medical. This lack of automated processing feedback makes it difficult to steer process development towards higher yields in micro-components and MEMS production. Another visible problem is the need to document and record process data, even on the individual device level, with the degree of traceability as is required for example, for medical devices fabricated under ISO13485. Both factors in the end limit the possibility of reliable and cost effective manufacturing of MEMS and micro-components. Thus, CITCOM has been proposed to address the industrial needs of MEMS and micro-manufacturing which will offer an in-line production inspection and measurement system for micro-components. The system will be developed and demonstrated at TRL7. The system will be based on optical and X-ray techniques combined with computer tomography and advance robotic system capable of analyzing defects that occur in production of micro components e.g. stains, debris, fracture, abnormal displacements, chemical composition of surface coatings, surface traces etc. enabling 98% yield and 100% reliability. Ultimately, CITCOM will cut such costs by 60% as it will offer a system with automated knowledge and inspection data based process feedback that will allow the detection and traceability of faults that may occur in MEMS production, especially for critical applications like aerospace, space and healthcare. CITCOM will give Europe a technological and competitive advantage in the growing manufacturing and production industry. The consortium behind this action is strongly driven by industrial need and problem having Philips and Microsemi as end users and validators of the technology.

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